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Contents
Release of QST-2002-Plus
Release of QST-2002-RT
Release of DSI-3000
Release of QST-2002-HF
Announcing release QST-2002-Plus Test
System
Now
available is the latest generation of QST2002 System, called the QST2002-PLUS.
The 'PLUS' is available in both the Tabletop version (QST2002-PLUS) and also the
Rackmount version (QST2002E-PLUS, for Wafer, Bar, Slider, 2002HF, and 2002RT
applications). These 'PLUS' systems will have all the functionality of the
existing systems but will also include the new HSD-500 Module (500 Ms/sec High
Speed Digitizer Module). The HSD-500 Module is a significantly-improved version
of the AC Measurement channel and replaces the original 160Ms/sec ADC Channel.
The PLUS systems with HSD-500 Module have the following key benefits over the
previous non-PLUS systems:
§
Higher
UPH. In 500Ms/sec mode the SMAN/SMAN-2 tests will run 20% - 100% faster than
the current 160Ms/sec channel
§
500Ms/sec
mode for 3x improvement in AC measurement resolution
§
Higher
bandwidth measurement capability, of up to 200Mhz bandwidth, compared to 80Mhz
bandwidth limitation of the current digitizer channel
§
Improved
low-frequency bandwidth, down to 200Khz, for low-frequency noise measurements
§
160Ms/sec
'backwards-compatibility' mode, to operate like existing QST2002/QST2002Es with
existing software
§
New
Software capabilities for 500Ms/sec mode
Announcing release QST-2002-RT 12xHGA Reliability Test
System
The QST-2002-RT
tester uses the same core measurement capabilities as the QST-2002/QST-2002E
with Gen3 Front-end Electronics.
The QST-2002-RT can stress and test in-situ up to 12 HGA's at various
user-defined temperatures and is designed to be part of a large HGA sample
population testing for HGA life prediction. The mode of operation is to apply
V/I Bias stress to the MR sensor (or additionally any combination of Bias
stress, Write stress, Magnetic Field Stress, DFH Stress, and Bias Pulsing
stress) at elevated temperatures for an extended period of time, then perform
standard QST and AC Channel measurements as metrics of performance degradation.
Performance metric measurements include Transfer Curve and Resistance analysis,
and the most advanced instability detection system of any QST Tester available
today. These measurements, performed through a unique High Frequency channel
with integrated digital oscilloscope, include Popcorn, AC Noise, and Spectral
Maximum Amplitude Noise (SMAN).
Two versions of thermal control are available for this system. The first is a
Hot-only option, allowing measurements of the MR elements when thermally
stressed from ambient to up to 250C. The second is a Hot/Cold option that
includes a self-contained humidity-controlled environment for measurements
within the range of -20C to 80C.
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Announcing release DSI-3000 Die/Slider Sorter Inspection
System
The
DSI-3000
is a high throughput slider sorter that uses seven axes of motion and three
vision systems to accurately pick and place Pico, Femco, and Femto type sliders.
The system is ideal for at least two applications in slider fab process:
The system can be configured to pick from up to 2 user defined input de-bond
trays, perform optional OCR (Optical Character Recognition) and place sorted
sliders into 20 standard 2x2” waffle trays.
Alternatively, the system can be configured to pick from up to 10 standard 2x2”
waffle trays, perform optional visual defect inspection of the pad side surface
of the slider and place sorted slider into 20 standard 2x2” waffle trays.
The DSI-3000
sorter uses unique mechanical arrangement to achieve 2300 UPH including OCR. It
uses latest OCR technology to achieve OCR accuracy rates of 99.9%.
The DSI-3000
uses an ISI proprietary Active Nozzle that can contact slider with close to zero
force, detect when contact is made, and gently pick up the slider with an ESD
dissipative nozzle. The Active Nozzle can also sense deflection and tell if the
slider is missing or is at the wrong z-height. This technology makes the
DSI-3000
ideal for handling extremely small, fragile, and ESD sensitive devices such as
Femto sliders.
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Announcing release QST-2002-HF High Field QST Tester
The QST-2002HF is an engineering test system for characterizing the
performance of MR Heads at the Head Gimbal Assembly level at magnetic fields up
to 15,000 Oe
Low Frequency measurements include Resistance and Transfer Curve analysis. High
Frequency measurements include the most advanced instability detection system
available today. These measurements, performed through our unique HF channel
with integrated digital scope, include Popcorn, HF Noise, and patented Spectral
Maximum Amplitude Noise (SMAN).
Transverse Transfer Curve at Extremely High Fields
Longitudinal Transfer Curve at Extremely High Fields
The ultra high range of the QST-2002HF allows observation of sensor
characteristics such as pin layer reversal and demagnetization in extreme
conditions. It is capable of resetting the hard magnetic layer at HGA and HSA
level by applying extremely high longitudinal magnetic field. Other applications
include initialization investigation and environmental robustness.
The full suite of stress conditions include field up to 15000 Oe, write current
to 60 mA 0-pk , bias current to 20 mA, full DFH exercise, and elevated
temperature.
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For More Information Contact:
Integral Solutions Int'l
3000 Olcott St., Santa Clara, CA 95054
Tel: 408 653-0300
FAX: 408 653-0309
Internet:
info@us-isi.com
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