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The
BLAZER-X5L
tester uses same field proven technology as
QST-2002
for measurements and an innovative mechanical platform that make it the
most advanced Row/Bar level QST Lifecycle Tester.
The BLAZER-X5L
can test two bars simultaneously with up to 96 write/read stress channels
at elevated temperature. The mode of operation is to apply V/I Bias stress
to the MR sensor (optional Write stress to Writer) at elevated temperature
for an extended period of time, then perform standard QST and AC Channel
measurements as metrics of performance degradation.
Performance metric measurements include high speed Transfer Curve and
Resistance analysis, and the most advanced instability detection system of
any QST Tester available today. These measurement, performed through our
unique AC channel with integrated digital scope, include Popcorn, AC
Noise, Maximum Amplitude Noise (MAN) and Spectral Maximum Amplitude Noise
(SMAN).
The BLAZER-X5L’s
unique configuration separates the stress station from the QST measurement
station. Also unique electronics allow user to quickly switch between
Up/Down bars without re-aligning the probe cards.
The tester comes equipped standard with one Vision System for Probe Card
Alignment.
Key Benefits
- Pad miss-contact detection
- Four point resistance measurement
- Up/Down slider selection with single Probe Card
- Writer resistance measurement
- Contacts grounded during probing
- Supports Pico and Femto type sliders Compact footprint
- Probe contacts both writer and reader
- Simple Probe Card Alignment
- Position limit sensors
- Position verification encoders
- Up to 96 parallel Write/Read stress channels
- Simulteneous Write, Bias and Temperature stress
- Simulteneous Write stress of up to 16 channels
- Independent Bias control for all 96 ch
- True V/I Bias modes
- Writer and MR resistance mea surements
- Probe contact verification
- Up to 150° C, both bars simultaneous
- Closed loop temp control
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