STTRam module Release Notes

Version 3.2.0 May 17 2012
- Added: ELG and Aux device for DC measurements

Version 3.1.0 May 8 2012
- Added: no longer uses DCAdditional gain from quasi, symmetric changes to sttpulserlib 3.3.0

Version 3.0.5 Mar 16 2012
- Added: Pulser splitter is part of Quasi97

Version 3.0.2 Mar 6 2012
- Added: Supporting STTPulserLib

Version 2.0.3 Oct 31-2011
- Re-Release: Recompiled with latest quasi version 5.2.2

Version 2.0.2 Oct 31-2011
- Added: Field write probability Test

Version 2.0.1 (Sep 19 2011)
- Fixed: if resistance is negative (due to cross channel short), then v-switch exited without generating result. This caused logresults: subscript out of range on some heads in production test.
- Fixed: resistance could be negative because of two devices shortage when higher bias applied to not current channel.
- Fixed: H-Transverse dual channel in production mode not for all cycles results were published for the second channel.

Version 2.0.0 (Sep 12 2011)
- Added: Dual channel mode capability.
- Added: Single Pulse Test.

Version 1.3.11 (Aug 16 2011)
- Changed: Vswitch test only allowed positive reset field, changed to allow reset field of any polarity.

Version 1.3.9 (Apr 22 2011)
- Fixed: Fixed the problem in MTJRes test

Version 1.3.7 (Apr 12 2011)
- Fixed: Because of rounding error Endurance test could be resetting the field to ever higher value, eventually causing the QPS-1050 to blow a fuse. 

Version 1.3.6 (Feb 3 2011)
- Added: In Write Probability Test: Changed how raw res data was logged, to allow for maximum
	data logging to excel file. Was initially logged with cycles in columns, changed for cycles
	to be logged by rows.

Version 1.3.5 (Feb 2 2011)
- Added: In Write Probability Test: Added capability to log raw res data.

Version 1.3.4 (Dec 9 2010)
- Added: In Write Probability Test: increased number of significant digits that are shown.

Version 1.3.3 (Aug 5 2010)
Broke compatibility with previous version. Modules that have reference to STTRAM.dll will have to be recompiled here.
- Added: Maximum number of cycles in the Write Probability test is changed to 1e7
- Fixed: The stress parameters were not restored in the WriteProbability test, Read Disturb and MTJResistance tests.
- Fixed: The stress parameters button was not highlighted in the Breakdown Voltage test, when there were stress items present.

Version 1.3.2 (May 5 2010)
- Fixed: Vbreakdown test and Endurance test plots did not have partID or head number
- Fixed: V-Transfer in Ibias mode with Skip on threshold flag stopped early.

Version 1.3.1 (May 4 2010)
- Fixed: Occasional Overflow error in the MTJ resistance test
- Fixed: Endurance test did not check for maximum number of iterations supported by hardware
- Fixed: VBreakdown test did not sweep negative values correctly

Version 1.3.0 (Mar 24 2010)
Must be installed with Quasi97 4.7.23
- Fixed: H-Transfer resistance offset 
- Added: negative voltage sweep in v-breakdown test
- Added: Amplitude calibration in the STTRAM Control Menu

Version 1.2.3 (Mar 12 2010)
- Fixed: Rh result in H-Transfe test was reported lower than in reality.
- Fixed: H-Transfer test could subtract DC offset at the beginning or the end of the test. For MTJ that did not return to the same resistance, this could offset both Rl and Rh.
- Fixed: H-Transfer did not turn on AutoLowGain offset calibration, which could result in incorrect resistance reading.

Version 1.2.1 (Mar 3 2010)
- Fixed: Did not allow pulses wider than .3mS
- Fixed: STTPulser board calibration.

Version 1.1.14 (Jan 20 2010)
- Fixed: Error in applying calibration offset when measuring resistance. Esp Visible at low currents in V-Transfer test.
- Added: V-Transfer test time improved
- Added: Increased allowed stress time to 24 hours in VBreakdown test

Version 1.1.13 (Jan 15 2010)
- Fixed: Error in applying calibration offset when measuring resistance. Esp Visible at low currents in V-Transfer test.

Version 1.1.12 (Jan 7 2010)
- Fixed: When running H-transfer in symmetric mode, the resistance result was incorrect.

Version 1.1.8 (Jan 7 2010)
- Added: The H-Transfer test does not have to go through 0Oe field

Version 1.1.7 (Dec 24 2009)
- Added: Current sense mode capability to run standard QST tests

Version 1.1.6 (Nov 18 2009)
- Fixed: When deleting H-Transfer, Stress:Restoreparameters error.
- Fixed: When the Sweep from is close to switching field, then the wrong resistance could be reported in the H-Transfer test

Version 1.1.4 (Oct 26 2009)
- Fixed: Pulse width test plot extends the fitted line to measure at value

Version 1.1.3 (Oct 26 2009)
- Fixed: V-Transfer did not show Rh coefficients correctly, and the switch point was wrong.
- Fixed: When displaying all curves in Write probability, the legend was not updated

Version 1.1.2 (Oct 23 2009)
- Added: Annotation for each subset on the read disturb test plot
- Added: Pulse width annotation to the write probability plot
- Fixed: Write probability and Read Disturb test now accept only positive parameters for field, and pulse amplitude. The test will reverse them automatically depending on Rl/Rh selection
- Added: Results in V-Transfer test for converting from voltage to current.
- Fixed: Scale in Read Disturb and Write Probability Tests
- Added: Smoothing algorithm in the Read Disturb test.

Version 1.1.1 (Oct 08 2009)
- Fixed: number of pulses was doubled during the test.

Version 1.0.0 (Sep 21 2009)
- Initial Release