Analyzing magnetic film performance is critical to the design
and production of Magnetic Recording Heads and Magnetic RAM devices.
The WLA-3000 Automated
Wafer Level Analyzer can be integrated with a variety of industry
standard Automated Wafer Probers to characterize magnetic properties of
finished devices, test structures, and bulk thin films.
The RIA-2008 is the world's
first Static Writer Analyzer that characterizes the magnetic performance
of the head's inductive writer by analyzing relative inductance while
applying combination of various I-Bias and multi-directional magnetic
fields. The measured magnetic performance of the writer shows strong
correlation to its performance in the drive.
FMRA-2008 is the world's first commercially
available Ferro Magnetic Resonance Analyzer that characterizes the
magnetic performance of Magneto-Resistive sensors in multi-directional
magnetic fields. Characterizing the MR sensor using Ferro Magnetic
Resonance techniques can not only examine the sensor performance, but,
often, pinpoint a particular problem in the design or manufacturing
process, such as concerns with the Hard-Bias or the Reference/Pinning
Layer.
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