TSKWafer Version 3.0.29 (Aug 31 2022) - Added: support of "Wafer Setup File" info in log file Version 3.0.28 (Aug 19 2022) - Fixed: Display warning messages for obsolete "Check for Magnet Overheat" feature. Similar feature can be found as "Magnet Overheat" in Production test. Version 3.0.27 (Aug 13 2020) - Fixed: Probecard temperature alignment message will be displayed only once in multi-sequence production. Version 3.0.26 (Jul 17 2020) - Fixed: The "Ignore QST" diagnostic flag in mechanical driver is reset to False after running production test with custom setup in Operator mode. Version 3.0.25 (Jan 23 2020) - Fixed: Probe tip cleaning issues. Version 3.0.24 (Dec 23 2019) - Added: Probe tip cleaning option to allow cleaning during testing. - Fixed: Cleaning type and Cleaning enabled flag are not saved/restored correctly. Version 3.0.23 (Dec 13 2019) - Added: Probe tip cleaning. Version 3.0.22 (Sep 24 2019) - Fixed: If user enters a new reference die y-offset value to text box on Wafer Description menu, the new value will not be saved to database file. Version 3.0.21 (May 16 2019) - Fixed: Multi-sequence operator mode production test may not run correctly in some configurations. Version 3.0.20 (May 1 2019) - Added: Support for multiple sequences in operator mode production test is added. - Fixed: The XY position of a block is not displayed correctly. - Fixed: The "untested" values are not displayed on Wafer Slider Map menu. Version 3.0.19 (July 26 2018) Fixed: In Tester/Options if Auto change log file for every wafer was selected, would keep on appending the name to the previous name. Version 3.0.18 (Feb 5 2018) - Added: Confirmation of Probe Card Offset Change - Fixed: Apply Maps to all blocks was not working properly - Fixed: Wafer map image in Wafer Map was not displayed Correctly Version 3.0.17 (Dec 18 2017) -Added: Code to turn Allignment Camera LED off -Fixed: If Add blocks was repeatably clicked, would cause freeze up error. -Added: 1 second delay between stb reads in unload function. Could sometimes read wrong bits if it was read too fast Version 3.0.16 (April 4 2017) -Fixed: In Wafer Description Settings, was limiting the RefX pos to a short value. Version 3.0.15 (March 7 2017) -Fixed: Was not logging the X/Y position tested correctly. Was inverting X/Y Version 3.0.14 (Aug 24 2016) -Added: Selection in tester options to turn off warning to re-align probe card at temperature if running in cassette mode. -Fixed: If grading enabled: error occured when trying to determine grade Version 3.0.13 (July 27 2016) Fixed: Load Wafer from cassette was not working properly. would only load first and second wafer Version 3.0.12 (July 24 2016) Fixed: Compiled with Quasi 7.41.20 which did not have correct license: gave license error on startup. Version 3.0.11: July 21 2016 -Fixed: Load Wafer from cassette was not working properly Version 3.0.10: July 07 2016 -Fixed: GPIB Configuration was not terminated properly -Fixed: ErrorLog was not being logged in load wafer if an error happend. Version 3.0.9: May 26 2016 -Fixed: If existing wafer map opened, did not update the main form with new values, until form was minimized and reactivated. Version 3.0.6: Nov 13 2015 -Fixed: Errors related to using WaferSN functionality -Added: Broken bar extended capability Version 3.0.5: Sept 15 2015 -Added: .NEt release Version 3.0.0: Mar 5 2015 -Added: .NEt release Version 2.0.8: Oct-20-2014 -Added: Added Capability for magnet overheat check to delay till magnet resistance cools down below certain value. Version 2.0.7: Sept-17-2014 -Fixed: Did not set channeltoprobe correctly on startup. If ch1 was selected in tester options, used ch0 by default Version 2.0.6: March-26-2014 -Fixed: error if alignvideo was not found in hardware config table Version 2.0.5: March-19-2014 -Added: Capability to change direction of which way prober moves based on move commands. Version 2.0.4: Jan-21-2014 -Fixed: Win7 compatibility (was not checking in correct appdata folder for ini file) Version 2.0.3: Jan-21-2014 -Fixed: Win7 compatibility (tskwafer.ini file is not stored in appdata folder) Version 2.0.2: Jan-15-2014 -Added: capability to access TSK dll version functions Version 2.0.1: July-25-2013 -Added: checkbox to check for magnet overheat in tester options. Version 2.0.0: July-19-2013 -Added: Module becomes a DLL, compatible with hardware config table -Added: Compatible to Quasi97 .NET Version 1.0.16: feb-11-2013 --added: check to see if wafer load issues fixed Version 1.0.15: sept-04-2012 --Fixed:Error with vdmatrox addition to hardware config table. --Aborts TSK Wafer testing if magnet trip occurs Version 1.0.14: Jul-05-2012 --Added:added longer delay for wafer read id. Version 1.0.13: Jun-27-2012 --Added:added application class, so users can get access to tsk functions and classes. Version 1.0.12: Jun-22-2012 --Added:added Error Logging Capability for Load wafer function. Version 1.0.11: Jun-19-2012 --Fixed:added delay time after loading wafer to account for reading wafer ID. Version 1.0.10: Jun-18-2012 --Fixed:added more srq checks for after loading wafer. Version 1.0.09: May-23-2012 --Fixed:Constant stopping and restarting when moving to each head Version 1.0.08: May-21-2012 --Fixed:Double probing when moving to a new block: probes unprobes twice before starting test --Fixed:Error if single slider mode selected and trying to move across the wafer. Version 1.0.07: May-21-2012 --Fixed:Double probing when moving to a new block: probes unprobes twice before starting test --Fixed:Error if single slider mode selected and trying to move across the wafer. Version 1.0.06: May-16-2012 --Fixed:Unhandled Prober errors when sometimes loading diagnostics form Version 1.0.05: May-15-2012 --Fixed: Object database error --Fixed: with 3000EX probers, more die capability, could not move to ref die location correctly. Version 1.0.04: May-01-2012 --Compatability with UF3000EX Version 1.0.03: March-20-2012 --Fixed: Wafer Map update form always jumped to a new location when trying to select parts to test. --Fixed: Errors raised if last wafer map used not found: changed to switch to generic db, if this occurs --Fixed: Error in reporting of x position in dual channel mode. Was same for both channels. Version 1.0.02 -Fixed Errors Version 1.0.01 (Sept 19 2011) --Added: Capability of testing dual Channel --Fixed: Error in Dual Channel testing Version 1.0.0000 (Aug 12 2011) Initial Release