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<lastmod>2022-05-02</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/sot-mram-to-challenge-sram</loc>
<lastmod>2022-01-13</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/snia-pm-%26-cs-summit-advances-and-isi-sot-mram-tester</loc>
<lastmod>2021-06-05</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/successful-mram-production-requires-good-magnetic-test-equipment</loc>
<lastmod>2021-06-05</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/qst-noise-report</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/esd-testing-of-gmr-heads-as-a-function-of-temperature</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/a-new-generation-esd-stress-system-for-mr-head-testing</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/a-comparison-of-quasi-static--characteristics-and-failure-signatures-of-gmr-heads-subjected-to-cdm-and-hbm-esd-events</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/measuring-and-specifying-limits-on-current-transients-and-understanding-their-relationship-to-mr-head-damage</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/quasi-static-testing-solution-for-cost-effective-quality-verification-and-esd-testing</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/degradation-of-gmr-and-tmr-recording-heads-using-very-short-duration-esd-transients</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/noise-and-discontinuities-in-gmr-transfer-curves</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/standardized-direct-charge-device-model-esd-test-for-magnetoresistive-recording-heads-ii</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/standardized-direct-charge-device-model-esd-test-for-magnetoresistive-recording-heads-i</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/characterization-of-perpendicular-write-heads-using-inductance-measurements</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/a-dynamic-scratch-test-to-study-read%2Fwrite-head-degradation-due-to-head-disk-interactions</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/an-investigation-of-noise-increased-in-tmr-readers-during-drive-operation</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/challenges-of-cost-effective-screening-of-current-and-future-tmr%2Fpmr-design-heads</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/advanced-quasi-static-testing-technology-and-applications</loc>
<lastmod>2021-06-03</lastmod>
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<loc>https://www.us-isi.com/isi-in-the-news/high-frequency-instabilities-in-gmr-heads-due-to-metal-to-metal-contact-esd-transients</loc>
<lastmod>2021-06-03</lastmod>
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