TELWafer Application v2.0.22
Version 2.0.22 (Aug 13 2020)
- Fixed: Probecard temperature alignment message will be displayed only once in multi-sequence production.
Version 2.0.21 (July 31 2020)
- Fixed: A bug in "Auto Update Root Ref Pos" such that the reference die position is not updated to root of block.
Version 2.0.20 (July 14 2020)
- Added: A new option, "Auto Update Root Ref Pos", is added. If it is enabled, the reference position of the
root of blocks will be updated by reference die offests automatically.
Version 2.0.19 (May 21 2020)
- Fixed: The "Ignore QST" diagnostic flag in mechanical driver is reset to False after running production
test with custom setup in Operator mode.
- Added: A new option, "Move X,Y Separately", is added. If it is enabled, the wafer movement will be done by
moving X-direction and y-direction separately.
Version 2.0.18 (Dec 19 2019)
- Fixed: ISIRemoteOp cannot load TEL driver.
Version 2.0.17 (Dec 12 2019)
- Added: Recalculate reference die offsets whenever a wafer is loaded; rather than reuse the saved values from database.
A new option, "Recalc Ref Die Offs", is added in Tester Options menu to enable/disable it. Default value is disabled.
Version 2.0.16 (Sep 24 2019)
- Fixed: If user enters a new reference die y-offset value to text box on Wafer Description menu, the new value
will not be saved to database file.
Version 2.0.15 (June 19 2019)
- Fixed: Cannot start wafer SN module.
- Added: Extend wafer loading timeout duration
Version 2.0.14 (May 16 2019)
- Fixed: Multi-sequence operator mode production test may not run correctly in some configurations.
Version 2.0.13 (May 1 2019)
- Added: Support for multiple sequences in operator mode production test is added.
Version 2.0.12 (Dec 19 2018)
Added: Dynamic Device Selection: allows user to dynamically select which dies to test based on the ID of the wafer, using csv file.
Tester Options: added option to enable dynamic device selection, added option to select csv file of waferIDs and dynamic map files,
added option to supress warning message that tells user dynamic device selection is enabled.
Wafer Slider Map: added button to generate dynamic map file based on the current wafer map, added button to load a dynamic map to make changes or
to view which dies are selected (also displays dynamic map if one is currently loaded).
Version 2.0.11 (Nov 1 2018)
Added: Tester Options: added option to overwrite original file name with updated auto log selections. Would usually not overwrite
the file name selected by the user for the initial autolog selections.
Version 2.0.10 (Aug 18 2018)
Fixed: Giving X/Y out of stage Transfer Destination Exceeds software limit, if index move occured and did not get correct SRQ back.
Version 2.0.9 (July 26 2018)
Fixed: In Tester/Options if Auto change log file for every wafer was selected, would keep on appending the name to the previous name.
Version 2.0.8 (Jun 11 2018)
Added: Wafer Load Timeout was occuring due to long wafer ID read. Changed the wafer delay time from 250ss to 350s.
Version 2.0.7 (Apr 12 2018)
Added: Interface to get the Forms in the application class.
Version 2.0.6 (Aug 17 2017)
Added: Integrated Tel Precio prober with gems software
Version 2.0.5 (Aug 09 2016)
Fixed: Load Wafer from cassette was not working properly. would only load first and second wafer
Version 2.0.4 (July 24 2016)
Fixed: Compiled with Quasi 7.41.20 which did not have correct license: gave license error on startup.
Version 2.0.3 (July 08 2016)
Fixed: Error in map: if selecting to show anything other than enable, error would occur
Fixed: Error in cassette loading
Version 2.0.2 (July 07 2016)
Fixed: Error when quasi setupfile opened
Version 2.0.0 (May 15 2016)
Version 1.2.1 (Jan 14 2014)
Added: Test order was not being set. caused some problems with using shell tests.
Version 1.2.0 (Dec 18 2014)
Added: Win7 compatibility (telwafer.ini file is stored in c:programdata folder for windows 7)
Version 1.0.9 Build 6 (June 18 2014)
Added: Added delay after every write for prober to respond.
Version 1.0.9 Build 5 (June 12 2014)
Added: Added greater GPIB timeout for device parameters call.
Version 1.0.9 Build 4 (June 12 2014)
Added: debug modes to check gpiberrors
Version 1.0.9 Build 3 (June 10 2014)
Added: Addition to select after how many devices to step: Works with Shell tests for selecting what tests to run on what channel.
Version 1.0.9 Build 2 (June 10 2014)
-Fixed: Prober online checks was taking 10 seconds per call; reduced to 100ms.
Version 1.0.9 (Apr 28 2014)
-Added: switched to index movements: This was added already in version 1.0.6
-Fixed: Error that props up when checking if prober online.
Version 1.0.8 (Feb 28 2014)
-Fixed: Overflow error in clearing prober function
Version 1.0.7 (Feb 28 2014)
-Added: added more information into PRober find function, for help in finding errors
Version 1.0.6 Build 2 (Feb 26 2014)
-Fixed: Ini file marked as permanent in install file, so that it is not deleted during un-install
Version 1.0.6 (Feb 26 2014)
-Fixed: Current Head Initiate Error: wrong number of arguments. Related to updates in Quasi97 to head dimensioning array
Version 1.0.0005 (Sept 26 2013)
Fixed: Increased delay time after prober clears, for prober to come back online to 250ms
Version 1.0.0004 (Aug 19 2013)
Fixed: Increased delay time after prober clears, for prober to come back online from 50 to 100ms
Version 1.0.0003 (Aug 19 2013)
Initial Release; Version shipped with first System
Version 1.0.0000 (Aug 19 2013)