FMRA-2008
Ferro-Magnetic Resonance Module

The FMRA-2008 Module accurately measures magnetic resonance at RF frequencies up to 20Ghz, ideal for characterizing the RF magnetic performance of Magneto-Resistive sensors in multi-directional magnetic fields.

Key Benefits

  • RF Probecard and connection with measurement range up to 20Ghz

  • Compatible with our standard test suite

  • Low Noise measurement system

  • Comprehensive MR Analysis 

  • Open architecture software allowing custom module design

  • Available with either ISI's WLA5000 Wafer or BlazerX6B Bar Analyzer platforms

  • Fully integrated with our software, power supplies, and test platform

Overview

ISI's proprietary FMRA-2008 Module accurately measures magnetic resonance at RF frequencies up to 20Ghz, ideal for characterizing the RF magnetic performance of Magneto-Resistive sensors in multi-directional magnetic fields. Characterizing the MR sensor using Ferro Magnetic Resonance techniques can not only examine the sensor performance, but, often, pinpoint a particular problem in the design or manufacturing process, such as concerns with the Hard-Bias or the Reference/Pinning Layer. 

 

The FMRA-2008 electronics module is intended for use with QuadPole magnet systems on either the WLA5000 Wafer Analyzer or the BlazerX6B Bar Analyzer, and incorporates RF Probing and multi-directional field vectors to allow the extensive suite of FMRA-2008 measurements. These measurements include:

  • Ferro Magnetic Resonance Spectrum Analysis

  • Diagnostics of hard bias level and uniformity

  • Stiffness field measurement 

  • Reference layer/Pinning layer diagnostics

  • Free layer uniformity and domains detection

  • Free layer magnetization orientation

  • High Bandwidth Noise Analysis

As MR sensor dimensions shrink in the race to higher Arial Density, control of the reader sensor dimensions becomes more difficult causing many of the above issues. The FMRA-2008 is world's first low-cost, non-destructive, in-situ solution to characterize these issues in a manufacturing environment with production-level throughput. 

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