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Press Releases
Find Press Releases published by ISI regarding product updates, new partnerships, special announcements, and more.
ISI Continues To Be The Leader In Repeat Orders Of WLA Wafer Testers
SANTA CLARA, CA – July 13, 2023: Integral Solutions International (ISI), the world’s leading manufacturer of wafer-level Magnetic Device testers, has just completed the shipment of two additional WLA Wafer Level testers, each to existing customers. Both of these new
Wafer Testers, one a WLA3000 and another a WLA5000, were reorders by ISI’s existing customers to satisfy the increased demand of their production-level test capacity.
July 13, 2023
PULSAR-8000 MRAM Pulse/Measurement System has Been Qualified by Tier-1 Customer
SANTA CLARA, CA – May 30, 2023: Integral Solutions International (ISI), the world’s leading manufacturer of wafer-level Magnetic Device testers, is pleased to announce that their PULSAR-8000 MRAM Pulse Generation and Measurement System has been qualified for use in Production by a Tier-1 customer.
May 30, 2023
ISI Granted Patent for Fastest MRAM Cell Characterization Tester
SANTA CLARA, CA – Nov 26, 2022: Integral Solutions International (ISI), the world’s leading manufacturer of wafer-level Magnetic Device testers, announces the granting of MRAM specific patent US11482295 titled “TESTING MAGNETORESISTIVE RANDOM ACCESS MEMORY FOR LOW LIKELIHOOD FAILURE”.
November 26, 2022
ISI Introduces World Class High Field Strength 3-Axis Magnet Test
Solution For MRAM And Mag-Sensor Products
SANTA CLARA, CA – March 1, 2022: Integral Solutions International (ISI), the world’s leading
manufacturer of wafer-level Magnetic Device testers, announces the release of its groundbreaking
3-Axis Magnet Option for wafer-level testing. Combined with the WLA5000 Tester, the 3D magnetic
fields produced by this system can be used for characterization of 2D/3D Magnetic Sensors, and
for characterization and qualification of magnetic-based memories such as MRAM.
March 1, 2022
Integral Solutions International (ISI) Appoints Semiconductor Memory Veteran to Advisory Board
San Jose, CA, Sep 07, 2021---- Integral Solutions International (ISI), the leading manufacturer of MRAM and Magnetic Sensor testers, today announced the appointment of Kevin M. Conley, a seasoned semiconductor memory veteran, to its Advisory Board.
September 7, 2021
ISI Releases Highest Performance 1.5 Tesla Perpendicular Magnet Option for WLA-5000 Wafer-Level Systems
SANTA CLARA, CA – August 5, 2021: Integral Solutions International (ISI), the world’s leading manufacturer of wafer-level Magnetic Device (MRAM, Sensor, Data Storage) testers, is pleased to announce the release of a 1.5 Tesla (15K Gauss) Perpendicular Magnet Option for use on the WLA-5000 Wafer Level Tester.
August 5, 2021
ISI Appoints Industry Veteran to Join Advisory
Leadership
San Jose, CA, June 30, 2021---- Integral Solutions International (ISI) the leading
manufacturer of MRAM and Magnetic Sensor testers, today announced the appointment of
Kenneth J. Huening, a seasoned semiconductor veteran, to its Advisory Board.
June 30, 2021
ISI receives order for two WLA3000 Wafer-Level Testers for in-line testing
SANTA CLARA, CA – June 15, 2021: Integral Solutions International (ISI), the world’s leading
manufacturer of wafer-level Magnetic Device (MRAM, Sensor, Data Storage) testers, announced
today an order has been received from a Tier-1 Device Manufacturer for two WLA3000 Wafer-
Level Production Test Systems.
June 16, 2021
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