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ISI in the News

Find Articles and Presentations from unaffiliated industry publications.

Degradation of GMR and TMR Recording Heads Using very short duration ESD Transients

Intermag 2002, Europe

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By Lydia Baril, Mark Nichols, Albert Wallash - Maxtor

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Standardized Direct Charge Device Model ESD Test for Magnetoresistive Recording Heads II

EOS/ESD Symposium 2002

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By L. Baril, A. Wallash - Maxtor Corporation & T. Cheung - Read-Rite Corporation

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