RIA-2008 Relative Inductance Module

ISI's proprietary RIA-2008 Module accurately measures relative inductance down to 10pH, ideal for characterizing the magnetic performance of the HDD inductive Writer elements and other nano-scale electromagnets by while applying a combination of various I-Bias and multi-directional magnetic fields.

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ISI's proprietary RIA-2008 Module accurately measures relative inductance down to 10pH, ideal for characterizing the magnetic performance of the HDD inductive Writer elements and other nano-scale electromagnets by while applying a combination of various I-Bias and multi-directional magnetic fields.

ISI's proprietary RIA-2008 electronics module is intended for use with QuadPole magnets on either the WLA5000 Wafer Analyzer, BlazerX6B Bar Analyzer, or the QST2002-PLUS HGA Analyzer, allowing support of multi-directional field vectors as incorporated within the extensive suite of RIA-2008 measurements. These measurements include:

  • Inductance saturation vs. write current and external field

  • Coil-To-Yoke coupling efficiency

  • Yoke anisotropy and flare response

  • Identify of yoke defects

  • Detecting hysteretic/domain write heads

  • Main Pole Defect detection

 

This list of advanced Writer analysis achievable with the RIA-2008, such as Coil-To-Yoke coupling, has demonstrated correlation with Overwrite results from dynamic testing. As dynamic testing becomes less cost-effective the demand for low cost static solutions has become critical. Further, the static nature of this test system allows upstream analysis of writer performance, making the RIA-2008 an extremely valuable tool for Wafer, Bar, and HGA applications.

Overview

Key Benefits

  • Extremely accurate relative inductance measurement system

  • Simple interconnect to ISI's Wafer/Bar Probecards and HGA interface boards

  • Built-in proprietary calibration circuit to eliminate interconnect parasitic inductance

  • MHZ Measurement Range for high accuracy

  • Compatible with ISI's standard test suite

  • Low Noise measurement system

  • Comprehensive Writer Analysis 

  • Open architecture software allowing custom module design

  • Available with either ISI's WLA5000 Wafer, BlazerX6 Bar, or QST2002-PLUS HGA Analyzer platforms

  • Fully integrated with our software, power supplies, and test platform