RIA-2008 Relative Inductance Module

ISI's proprietary RIA-2008 Module accurately measures relative inductance down to 10pH, ideal for characterizing the magnetic performance of the HDD inductive Writer elements and other nano-scale electromagnets by while applying a combination of various I-Bias and multi-directional magnetic fields.

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ISI's proprietary RIA-2008 electronics module is intended for use with QuadPole magnets on either the WLA5000 Wafer Analyzer, BlazerX6B Bar Analyzer, or the QST2002-PLUS HGA Analyzer, allowing support of multi-directional field vectors as incorporated within the extensive suite of RIA-2008 measurements. These measurements include:

• Inductance saturation vs. write current and external field

• Coil-To-Yoke coupling efficiency

• Yoke anisotropy and flare response

• Identify of yoke defects

• Detecting hysteretic/domain write heads

• Main Pole Defect detection

 

This list of advanced Writer analysis achievable with the RIA-2008, such as Coil-To-Yoke coupling, has demonstrated correlation with Overwrite results from dynamic testing. As dynamic testing becomes less cost-effective the demand for low cost static solutions has become critical. Further, the static nature of this test system allows upstream analysis of writer performance, making the RIA-2008 an extremely valuable tool for Wafer, Bar, and HGA applications.