The WLA5000-HDD Analyzer uses same field-proven technology as our entire line of HDD measurement equipment, integrated with a commercially-available Wafer handler, to provide a full suite of measurements for comprehensive Magnetic Sensor device analysis for the disc drive industry.
ISI's WLA5000-HDD Analyzer is an engineering and production test system to characterize magnetic properties of finished hard disc drive devices, test structures, and bulk thin films at Wafer level. Incorporating our proprietary measurement electronics, power supplies, probecards, controller, and magnet, ISI's WLA5000-HDD Analyzer is ideally suited for this task.
With our High Field Quad-Pole Magnet, the WLA5000-HDD can apply a user-defined field vector while measuring DC and High Frequency MR Response at each test site on the Wafer. Our proprietary magnet portfolio includes a vast array of user-interchangeable electromagnets, ideally suited for inplane, perpendicular, 3-axis, and high-field applications. All of our magnet configurations are designed with high-performance in mind, in producing low remanent fields, high magnetic field strengths, and large uniformity volumes across the area under test. Our inplane magnets allow for measurements to be performed as user-defined field angles, or as a function of field rotation.
WLA5000-HDD measurements include high speed Transfer Curve and Resistance analysis, and the most advanced magnetic instability detection system available. These measurements, performed through our proprietary optional AC measurement channel, include Popcorn Noise, AC Noise, and our patented and industry standard Spectral Maximum Amplitude Noise (SMAN) analysis.
Our WLA5000 HDD Analyzer can be integrated with a variety of industry standard Automated Wafer Probers to characterize magnetic properties of finished devices or test structures, under hot or cold environmental conditions. Our proprietary software supports a full array of engineering and production interfaces, data logging, grading, and normalization, and allows for customers to develop their own software modules.
The WLA5000-HDD is compatible with ISI's RIA-2008, FMRA-2008, and EPS-100 ESD Stress Modules, Thermal Chucks, and ISI's comprehensive line of QuadPole inplane and Perpendicular Wafer Magnets.
Low electronic noise
Ideal for QST testing at R&D, Failure Analysis and Manufacturing levels
Optionally includes patented SMAN magnetic instability measurement
Compatible with ISI's RIA-2008, FMRA-2008, and EPS-100 ESD Stress Modules, Thermal Chucks, and ISI's comprehensive line of QuadPole inplane and Perpendicular Wafer Magnets